Improved processes and more

Discover the full potential and benefits.

Download our ZEISS O-INSPECT duo flyer here.

ZEISS O-INSPECT duo combines two technologies in one single product and provides a solution for both, microscopy and metrology with optical and tactile measurements. The integration of the ZEISS ZEN core microscopy suite and ZEISS CALYPSO metrology software into one multisensor machine delivers unique benefits and helps to automate workflows, streamline setup and document results.

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