WEBINAR - Metrology Extension for 3D X-ray Microscopes

By adding Measurement Accuracy to X-ray Microscopy the MTX option extends ZEISS world-class metrology offerings to the well-known, high-resolution imaging capabilities of ZEISS 3D X-ray microscopes.

Learn more in this webinar 17th September 2020!

>REGISTER HERE

Highlights of webinar:

Combine high-resolution X-ray imaging with high-precision metrology capabilities.
Measure with an accuracy far beyond the limits of conventional X-ray CT metrology.
Use seamless accuracy verification in accordance with the VDI/VDE 2630-1.3 part 1.
Non-destructively inspect the design of a part’s complex internal and external features.
Reveal the smallest dimensions and measure them most accurately.